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Honda, Maki; Martschini, M.*; Marchhart, O.*; Priller, A.*; Steier, P.*; Golser, R.*; Sato, Tetsuya; Tsukada, Kazuaki; Sakaguchi, Aya*
Analytical Methods, 14(28), p.2732 - 2738, 2022/07
Times Cited Count:2 Percentile:45.92(Chemistry, Analytical)The sensitive Sr analysis with accelerator mass spectrometry (AMS) was developed for the advances of environmental radiology. One advantage of AMS is the ability to analyze various environmental samples with Sr/Sr atomic ratios of 10 in a simple chemical separation. Three different IAEA samples with known Sr concentrations (moss-soil, animal bone, Syrian soil: 1 g each) were analyzed to assess the validity of the chemical separation and the AMS measurement. The Sr measurements were conducted on the AMS system combined with the Ion Laser InterAction MasSpectrometry (ILIAMS) setup at the University of Vienna, which has excellent isobaric separation performance. The isobaric interference of Zr in the Sr AMS was first removed by chemical separation. The separation factor of Zr in two-step column chromatography with Sr resin and anion exchange resin was 10. The Zr remaining in the sample was removed by ILIAMS effectively. This simple chemical separation achieved a limit of detection 0.1 mBq in the Sr AMS, which is lower than typical -ray detection. The agreement between AMS measurements and nominal values for the Sr concentrations of IAEA samples indicated that the new highly-sensitive Sr analysis in the environmental samples with AMS is reliable even for high matrix samples of soil and bone.
Ueta, Shohei; Sasaki, Koei; Arita, Yuji*
Nihon Genshiryoku Gakkai-Shi ATOMO, 63(8), p.615 - 620, 2021/08
no abstracts in English
Vacik, J.; Naramoto, Hiroshi; Cervena, J.*; Hnatowicz, V.*; Peka, I.*; Fink, D.*
Journal of Nuclear Materials, 289(3), p.308 - 314, 2001/03
Times Cited Count:12 Percentile:64.73(Materials Science, Multidisciplinary)no abstracts in English
Wells, T. P. R.*; Sugiyama, Akira; Han, T. P. J.*; Gallagher, H. G.*
Journal of Luminescence, 85, p.91 - 102, 1999/00
Times Cited Count:31 Percentile:78.19(Optics)no abstracts in English
Komiyama, Kazumasa*; Okuno, Hiroshi
JAERI-Research 94-047, 39 Pages, 1994/12
no abstracts in English
Akabori, Mitsuo; Shiratori, Tetsuo
Journal of Nuclear Science and Technology, 31(6), p.539 - 545, 1994/06
Times Cited Count:16 Percentile:78.48(Nuclear Science & Technology)no abstracts in English
Oda, Tetsuzo
JAERI-M 93-052, 49 Pages, 1993/03
no abstracts in English
Ogawa, Toru
JAERI-M 92-210, 92 Pages, 1993/01
no abstracts in English
Umesaki, Norimasa*; Ono, Hideo; Igarashi, Kazuo*; *
Journal of Non-Crystalline Solids, 150, p.302 - 306, 1992/00
Times Cited Count:0 Percentile:0.05(Materials Science, Ceramics)no abstracts in English
Ono, Hideo; Igawa, Naoki; Ishii, Yoshinobu; Umesaki, Norimasa*; *
Journal of Nuclear Materials, 191-194, p.525 - 529, 1992/00
no abstracts in English
At. Spectrosc., 44(5), p.844 - 848, 1990/00
no abstracts in English
Radiation Physics and Chemistry, 27(5), p.407 - 409, 1986/00
no abstracts in English
; *; *; *
Thermal Conduct., 18, p.95 - 104, 1985/00
no abstracts in English
Furukawa, Kazuo; *
JAERI-M 83-050, 43 Pages, 1983/03
no abstracts in English
;
Journal of Nuclear Science and Technology, 20(5), p.400 - 404, 1983/00
Times Cited Count:8 Percentile:68.41(Nuclear Science & Technology)no abstracts in English
; Abe, Shinichi
Nuclear Instruments and Methods, 212, p.533 - 537, 1983/00
no abstracts in English
; ; ;
J.Electron Microsc., 31(2), p.191 - 193, 1982/00
no abstracts in English
Furukawa, Kazuo; *;
Proc.6th Symp.on Ion Sources and Ion-Assisted Technology, p.167 - 170, 1982/00
no abstracts in English
; ; ; Fujino, Takeo
Inorg.Chim.Acta, 54, p.L193 - L194, 1981/00
no abstracts in English
Furukawa, Kazuo; *;
Journal of Nuclear Science and Technology, 18(1), p.79 - 81, 1981/00
Times Cited Count:25 Percentile:95.65(Nuclear Science & Technology)no abstracts in English